Dec 02, 2007 11:15 pm EST KLA-Tencor's New Aleris 8500 Film Metrology System is Industry's Most Advanced Thickness and Composition Measurement Technology for 45nm and Beyond
Dec 02, 2007 11:15 pm EST KLA-Tencor Introduces Complete Measurement Solution for Critical 45nm Wafer Geometry Metrology Requirements
Nov 08, 2007 9:15 am EST KLA-Tencor Declares Regular Cash Dividend for Second Quarter Fiscal Year 2008
Aug 09, 2007 9:15 am EDT KLA-Tencor Declares Regular Cash Dividend for First Quarter Fiscal Year 2008 and Announces an Additional 10 Million Share Repurchase Program
