Feb 13, 2008 6:29 pm EST KLA-Tencor Declares Regular Cash Dividend for Third Quarter Fiscal Year 2008
Feb 13, 2008 9:00 am EST KLA-Tencor Introduces New TeraFab Family of Mask Inspection Systems for Wafer Fabs
Jan 29, 2008 9:00 am EST KLA-Tencor Extends the Aleris(TM) Film Metrology Family With Two New Systems
Dec 17, 2007 3:30 pm EST KLA-Tencor Extends Metrology Portfolio With SensArray Etch Measurement Suite
Dec 07, 2007 3:30 pm EST KLA-Tencor and Nikon Develop Automated Overlay Correction Tools for Cost-Effective Mix & Match 45nm Lithography
Dec 02, 2007 11:15 pm EST KLA-Tencor's New Aleris 8500 Film Metrology System is Industry's Most Advanced Thickness and Composition Measurement Technology for 45nm and Beyond
Dec 02, 2007 11:15 pm EST KLA-Tencor Introduces Complete Measurement Solution for Critical 45nm Wafer Geometry Metrology Requirements
