Mar 15, 2007 6:00 am EDT KLA-Tencor's New High-Resolution TeraScanHR System Takes Reticle Inspection to 45nm Node Production and Beyond
Feb 22, 2007 4:39 pm EST KLA-Tencor Announces $750 Million Accelerated Share Repurchase and an Additional 10 Million Share Repurchase Program
Feb 22, 2007 6:00 am EST KLA-Tencor Enhances New PROLITH 10 Lithography Optimization Product With Advanced OPC Exploration Capability for 32nm Designs
Feb 02, 2007 6:07 pm EST KLA-Tencor Declares Regular Cash Dividend for Third Quarter Fiscal Year 2007
Jan 30, 2007 3:00 pm EST KLA-Tencor's New Surfscan SP2XP Wafer Inspection System Combines Highest Sensitivity and Throughput to Enable 45nm Generation Defect-Free Wafers
