Jul 14, 2008 4:30 pm EDT KLA-Tencor Introduces New P-6 Surface Profiler System for Scientific and Solar Metrology
Jul 10, 2008 4:30 pm EDT KLA-Tencor Launches First Computational Lithography Tool To Address Double-Patterning Challenges
Jul 08, 2008 4:30 pm EDT KLA-Tencor Introduces 10th Generation E-beam Inspection System, Enabling 4Xnm and 3Xnm Production
Jun 30, 2008 8:01 am EDT KLA-Tencor Corporation Board of Directors Authorizes an Additional 15 Million Share Repurchase
Jun 05, 2008 4:30 pm EDT KLA-Tencor Launches New Archer 200 Overlay Metrology System for 32nm Lithography Control
Jun 02, 2008 2:00 am EDT KLA-Tencor Completes First Stage of Acquisition of ICOS Vision Systems; Purchases Over 96% of Outstanding Shares
