Sep 17, 2008 8:30 am EDT KLA-Tencor Introduces New Technology for Disk Drive Substrate and Media Defect Inspection
Sep 04, 2008 4:30 pm EDT KLA-Tencor Introduces New Surfscan SP2XP Monitor-Wafer Defect Inspection System for IC Fabs
Jul 14, 2008 4:30 pm EDT KLA-Tencor Introduces New P-6 Surface Profiler System for Scientific and Solar Metrology
Jul 10, 2008 4:30 pm EDT KLA-Tencor Launches First Computational Lithography Tool To Address Double-Patterning Challenges
