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KLA-Tencor Announces Settlement with Securities and Exchange Commission
Jul 25, 2007 2:42 pm EDT

KLA-Tencor Announces Settlement with Securities and Exchange Commission

KLA-Tencor Extends Inspection Tools Into the Metrology Realm With New SURFmonitor System
Jul 11, 2007 6:00 am EDT

KLA-Tencor Extends Inspection Tools Into the Metrology Realm With New SURFmonitor System

KLA-Tencor Announces Live Webcast of Upcoming Quarterly Earnings Call
Jul 10, 2007 3:00 pm EDT

KLA-Tencor Announces Live Webcast of Upcoming Quarterly Earnings Call

KLA-Tencor Drives Semiconductor Profiling Technology to 45nm with New HRP-350 System
Jul 09, 2007 6:00 am EDT

KLA-Tencor Drives Semiconductor Profiling Technology to 45nm with New HRP-350 System

KLA-Tencor Completes Its 45nm Defect Portfolio With New Generation Defect Review and Classification System
Jul 03, 2007 6:00 am EDT

KLA-Tencor Completes Its 45nm Defect Portfolio With New Generation Defect Review and Classification System

KLA-Tencor Boosts 45nm Defect Capture, Doubles Throughput with New Memory- and Logic-Specific Brightfield Inspection Systems
Jun 26, 2007 6:00 am EDT

KLA-Tencor Boosts 45nm Defect Capture, Doubles Throughput with New Memory- and Logic-Specific Brightfield Inspection Systems

KLA-Tencor Announces Live Webcast of Upcoming Investor Presentation
Jun 19, 2007 3:00 pm EDT

KLA-Tencor Announces Live Webcast of Upcoming Investor Presentation

KLA-Tencor Extends Industry's Darkfield Inspection Benchmark With New Puma 9150 Inspection System
Jun 19, 2007 6:00 am EDT

KLA-Tencor Extends Industry's Darkfield Inspection Benchmark With New Puma 9150 Inspection System

KLA-Tencor's New LithoWare Tool Gives Designers Advanced RET/OPC Capabilities That Save Design Time, Reduce Time-to-Production
May 30, 2007 7:00 am EDT

KLA-Tencor's New LithoWare Tool Gives Designers Advanced RET/OPC Capabilities That Save Design Time, Reduce Time-to-Production

KLA-Tencor Completes Acquisition of Therma-Wave
May 25, 2007 9:15 am EDT

KLA-Tencor Completes Acquisition of Therma-Wave

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