Oct 01, 2008 8:30 am EDT KLA-Tencor Completes Acquisition of Microelectronic Inspection Equipment Business Unit of Vistec Semiconductor Systems
Sep 30, 2008 4:30 pm EDT KLA-Tencor Introduces PROLITH(TM) 12 - A Computational Lithography Tool Aimed at EUV Lithography Challenges
Sep 17, 2008 8:30 am EDT KLA-Tencor Introduces New Technology for Disk Drive Substrate and Media Defect Inspection
Sep 04, 2008 4:30 pm EDT KLA-Tencor Introduces New Surfscan SP2XP Monitor-Wafer Defect Inspection System for IC Fabs
